This inventor holds 2 USPTO granted patents. Top assignee: Chinese Academy of Sciences. Active years: 2022.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2022
Title: Innovations of Dachun Gan in Stitching Measurement Technology.
Introduction
Dachun Gan is a notable inventor based in Chengdu, China. He has made significant contributions to the field of stitching measurement technology. With a total of 2 patents, his work focuses on enhancing the precision and efficiency of measuring concave spherical lenses.
Latest Patents
Dachun Gan's latest patents include a stitching-measurement device and a stitching-measurement method. The stitching-measurement device is designed to perform measurements on the surface of a concave spherical lens. It comprises an interferometer, a reference lens, and multiple adjustment mechanisms to ensure accurate positioning. This innovative device allows for the measurement of the lens without the need to incline the object being measured. Additionally, he has developed a detection device for detecting lens surfaces in a stitching interferometer. This device features a cylindrical detection frame with support mechanisms that balance the lens being detected, ensuring consistent axial support.
Career Highlights
Dachun Gan is affiliated with the Chinese Academy of Sciences, where he conducts his research and development. His work has been instrumental in advancing the technology used in optical measurements. His innovative approaches have garnered attention in the scientific community.
Collaborations
Dachun Gan collaborates with esteemed colleagues, including Fuchao Xu and Xin Jia. Their combined expertise contributes to the advancement of optical measurement technologies.
Conclusion
Dachun Gan's contributions to stitching measurement technology reflect his dedication to innovation and precision. His patents demonstrate a commitment to improving measurement techniques in the optical field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
