Curtis L Harbert

Title: Curtis L. Harbert: Innovator in Integrated Circuit Testing

Introduction

Curtis L. Harbert is a notable inventor based in Sherman, Texas. He has made significant contributions to the field of integrated circuits, particularly in the area of testing methodologies. His innovative approach has paved the way for advancements in precision testing.

Latest Patents

Harbert holds a patent for a method titled "Selective trim and wafer testing of integrated circuits." This patent describes a process for determining if a sample die is within specification. If the sample die meets the required parameters, it is deemed good. The method involves measuring the sample parameters repeatedly until a die fails the measurement test or requires trimming. In cases where a die fails or needs trimming, a 100 percent test and trim is performed. This innovative method enhances the reliability and efficiency of integrated circuit testing.

Career Highlights

Curtis L. Harbert is associated with Texas Instruments Corporation, a leading company in the electronics industry. His work at Texas Instruments has allowed him to apply his expertise in integrated circuits and contribute to the company's reputation for innovation and quality.

Collaborations

Harbert has collaborated with notable colleagues, including Rex Warren Pirkle and George Reeves. These collaborations have further enriched his work and contributed to advancements in the field of integrated circuits.

Conclusion

Curtis L. Harbert's contributions to integrated circuit testing exemplify the spirit of innovation. His patented methods have significantly improved the precision and reliability of testing processes in the electronics industry. His work continues to influence the field and inspire future advancements.