The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2005
Filed:
Jan. 15, 2003
Rex W. Pirkle, Denison, TX (US);
Curtis L. Harbert, Sherman, TX (US);
George Reeves, Sherman, TX (US);
Rex W. Pirkle, Denison, TX (US);
Curtis L. Harbert, Sherman, TX (US);
George Reeves, Sherman, TX (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
A method of selective trim and wafer testing of precision integrated circuits is provided by determining if a sample die is within specification. If so the sample parameters are measured and if the die passes the sample parameters the die is good and repeat the steps of determining if the die is within specification and measuring the sample parameters until a die fails the measurement test or requires a trimming and if a die fails a measurement test or requires trimming perform 100 percent test and trim.