Los Altos, CA, United States of America

Curt H Chadwick


Average Co-Inventor Count = 2.9

ph-index = 10

Forward Citations = 743(Granted Patents)


Location History:

  • Sunnyvale, CA (US) (1977)
  • Los Altos, CA (US) (1979 - 1987)
  • Los Gatos, CA (US) (1989 - 2000)

Company Filing History:


Years Active: 1977-2000

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17 patents (USPTO):Explore Patents

Title: Innovator Curt H. Chadwick: Pioneering Advances in Inspection Technologies

Introduction

Curt H. Chadwick, located in Los Altos, California, is a prolific inventor with an impressive portfolio of 17 patents. Throughout his career, he has made significant contributions to the field of inspection systems, particularly in the realm of semiconductor manufacturing.

Latest Patents

Among his latest innovations are two notable patents:

1. **Alignment correction prior to image sampling in inspection systems** - This invention details a method and apparatus for inspecting a wafer that defines at least one die. The process involves obtaining electronic images of two dies, determining the x and y offsets, and aligning these images prior to defect inspection. This alignment allows for accurate comparison and detection of any defects present.

2. **Electron beam inspection system and method** - This patent outlines multiple embodiments of a particle scanning system and an automatic inspection system. It describes how a particle beam is directed towards a substrate surface for scanning, accompanied by a selection of detectors to capture various particles. The system includes a fine x-y stage for substrate positioning and an electric field to enhance particle acceleration, ensuring precise measurements and inspections.

Career Highlights

Curt H. Chadwick has held significant roles in esteemed companies such as Kla Instruments Corporation and GTE Sylvania Incorporated. His contributions at these organizations have furthered the development of cutting-edge inspection technologies vital for semiconductor and substrate manufacturing.

Collaborations

Throughout his career, Chadwick has worked alongside talented professionals, including John D. Greene and Anil A. Desai. These collaborations have likely contributed to the innovative advancements in inspection techniques that have emerged from his efforts.

Conclusion

Curt H. Chadwick's inventive spirit and technical prowess have led to numerous advancements in inspection systems and methods. His work not only showcases his dedication to innovation but also plays a crucial role in enhancing the quality and reliability of semiconductor manufacturing processes. As he continues to shape the future of inspection technologies, his legacy as a leading inventor in this field is undoubtedly cemented.

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