This inventor holds 1 USPTO granted patent. Top assignee: Asm Assembly Automation Limited. Active years: 2004.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2004
Title: Curito M Bilan, Jr: Semiconductor Testing Invention.
Introduction
Curito M Bilan, Jr. is an inventor associated with Hong Kong, China, and Asm Assembly Automation Limited. His patent work addresses the handling and testing of singulated semiconductor devices.
Latest Patents
Bilan is credited with 1 patent: “Apparatus and Method for Testing Semiconductor Devices.” The invention describes an apparatus with a main body and a support member made from non-conducting, high-resistivity material. The support member contains multiple recesses, each designed to hold an individual singulated electronic device during testing. The disclosed method carries devices on support members through a testing process that may include one or more environmental control chambers.
Career Highlights
The available information connects Bilan’s invention to semiconductor-device testing and identifies Asm Assembly Automation Limited as his company. The patent focuses on supporting individual devices during testing and enabling their passage through controlled testing environments.
Collaborations
Bilan’s listed coworkers include Eric Chow and Ching Man Stanley Tsui. The available details do not specify their roles in the patent or the invention.
Conclusion
Curito M Bilan, Jr.’s patent describes a support system and testing method for singulated semiconductor devices, with an emphasis on secure handling and environmental control.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile