Craig Gordon Wall

Title: Craig Gordon Wall: Innovator in Scanning Probe Technology

Introduction

Craig Gordon Wall is a notable inventor based in Chandler, AZ (US). He has made significant contributions to the field of scanning probe technology, particularly through his innovative patent. His work focuses on enhancing the capabilities of probe-based apparatus for analyzing sample surfaces.

Latest Patents

Craig Gordon Wall holds a patent titled "Scanning probe based apparatus and methods for low-force profiling of sample surfaces and detection and mapping of local mechanical and electromagnetic properties in non-resonant oscillatory mode." This invention relates to multi-purpose probe-based apparatus and methods for providing images of surface topography. It also includes the detection and quantitative mapping of local mechanical and electromagnetic properties in a non-resonant oscillatory mode. The methods described in the patent involve filtering incoming probe signals, which provide time deflection curves. These curves are essential for controlling scanning and collecting data that reflects sample adhesion, stiffness, elastic modulus, and viscoelastic response, as well as electric and magnetic interactions. The invention allows for adaptive choice of an AFM's deflection set-point, enabling imaging at the contact repulsive force for precise surface profilometry. The stable thermal environment reduces apparatus thermal drift and improves overall performance.

Career Highlights

Craig is associated with Nt-mdt Development Inc., where he continues to advance his research and development efforts. His work has positioned him as a key figure in the field of scanning probe microscopy.

Collaborations

Craig has collaborated with notable colleagues such as Serguei Magonov and Sergey Belikov, contributing to the advancement of technology in their respective fields.

Conclusion

Craig Gordon Wall's innovative contributions to scanning probe technology have paved the way for enhanced surface analysis methods. His patent reflects a commitment to improving the precision and capabilities of probe-based apparatus.