Corinna Weigelt

Title: Corinna Weigelt: Innovator in Wafer Measurement Technology

Introduction

Corinna Weigelt is a notable inventor based in Langen, Germany. He has made significant contributions to the field of optical measurement technology, particularly in the area of wafer measurement. With a focus on precision and innovation, Weigelt has developed a unique device that enhances the accuracy of wafer measurements.

Latest Patents

Weigelt holds a patent for a "Device and method for measuring wafers." This device incorporates an optical coherence tomograph along with a scanning device that systematically scans the surface of the wafer at multiple measuring points. The design specifies that two measuring points must maintain a distance of 140 mm ≤ d ≤ 600 mm. An evaluation unit is responsible for calculating distance values and/or thickness values derived from the interference signals produced by the optical coherence tomograph. He has 1 patent to his name.

Career Highlights

Corinna Weigelt is currently employed at Precitec Optronik GmbH, a company known for its advancements in optical measurement technology. His work at Precitec Optronik GmbH has positioned him as a key player in the development of innovative measurement solutions.

Collaborations

Throughout his career, Weigelt has collaborated with talented individuals such as Stephan Weiß and Simon Mieth. These partnerships have contributed to the successful development and implementation of cutting-edge technologies in the field.

Conclusion

Corinna Weigelt's contributions to wafer measurement technology exemplify his commitment to innovation and precision. His patent and work at Precitec Optronik GmbH highlight his role as a significant inventor in the industry.