Tigard, OR, United States of America

Corbin L Champion


Average Co-Inventor Count = 2.5

ph-index = 2

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2009-2016

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4 patents (USPTO):Explore Patents

Title: Corbin L Champion: Innovator in Automated Testing Systems

Introduction

Corbin L Champion is a notable inventor based in Tigard, OR (US). He has made significant contributions to the field of automated testing systems, holding a total of 4 patents. His work focuses on enhancing the efficiency and flexibility of semiconductor testing processes.

Latest Patents

One of Champion's latest patents is an automated test system with edge steering. This innovative system allows a semiconductor device-under-test (DUT) to be evaluated by processing test programs that specify a number of edges per tester cycle, which may exceed the tester's generating capacity. The system includes circuitry that reduces the number of edges in each cycle based on operational data, simplifying the circuitry required for edge generation while maintaining programming flexibility.

Another significant patent involves synchronizing data from different clock domains. This apparatus includes first circuitry operating at a first frequency and second circuitry at a different frequency. The logic bridges these two circuits, enabling the second circuitry to appear to run an integer number of cycles of the first frequency. This design enhances the efficiency of operations performed by the second circuitry.

Career Highlights

Corbin L Champion is currently employed at Teradyne, Inc., where he continues to develop innovative solutions in automated testing. His expertise in semiconductor testing has positioned him as a key player in the industry.

Collaborations

Throughout his career, Champion has collaborated with notable colleagues, including John Robert Pane and Howard Lin. These partnerships have contributed to the advancement of technology in automated testing systems.

Conclusion

Corbin L Champion's contributions to automated testing systems reflect his dedication to innovation in the semiconductor industry. His patents demonstrate a commitment to improving testing efficiency and flexibility, making a lasting impact on the field.

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