Beijing, China

Cong Yin

This inventor holds 1 USPTO granted patent. Top assignees: National Institute of Metrology, China, Tongji University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Cong Yin. Retrieved from https://idiyas.com/inventor/cong-yin-uf40jwy8

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Cong Yin - Innovator in Fluorescence-Induced Effect Technologies

Introduction

Cong Yin is a prominent inventor based in Beijing, China. He has made significant contributions to the field of optical technologies, particularly through his innovative methods and devices.

Latest Patents

Cong Yin holds a patent for "Methods and devices of 425NM wavelength reference construction based on fluorescence-induced effect." This patent describes a method that includes a continuously tunable laser, an atomic furnace, a chromium atomic beam, an optical frequency comb, a frequency doubling optical path, a bias-preserving fiber beam splitter, a bias-preserving fiber beam combiner, a beat-frequency detection optical path, an optoelectronic receiver, and a frequency counter atomic furnace. This invention aims to enhance the precision of optical measurements.

Career Highlights

Throughout his career, Cong Yin has worked at notable institutions such as Tongji University and the National Institute of Metrology, China. His work has been instrumental in advancing the understanding and application of fluorescence-induced effects in optical technologies.

Collaborations

Cong Yin has collaborated with esteemed colleagues, including Xinbin Cheng and Xiao Deng. Their joint efforts have contributed to the development of innovative solutions in their respective fields.

Conclusion

Cong Yin's work exemplifies the spirit of innovation in optical technologies. His contributions continue to influence advancements in the field, showcasing the importance of research and collaboration in driving progress.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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