This inventor holds 1 USPTO granted patent. Top assignees: Global Ets, LLC, University of South Florida. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:

Years Active: 2025
Title: Cong Xu: Innovator in Integrated Circuit Testing
Introduction
Cong Xu is a notable inventor based in Odessa, Florida, recognized for his contributions to the field of integrated circuit testing. With a focus on enhancing the efficiency and accuracy of testing methods, Xu has developed innovative solutions that address the complexities of modern electronic devices.
Latest Patents
Cong Xu holds a patent for "Systems and methods for testing integrated circuits independent of chip package configuration." This invention includes a socket designed to receive a device under test (DUT), featuring multiple input and output pins. The DUT is equipped with several device pins, and the system incorporates a wireless communication device that transmits information about the DUT to a server running a machine learning (ML) model. The system can wirelessly receive response data from the server, which includes pin configuration and timing configuration information. Additionally, a switch array is utilized to route the device pins to the corresponding output pins based on the response data.
Career Highlights
Throughout his career, Cong Xu has worked with esteemed organizations such as the University of South Florida and Global Ets, LLC. His experience in these institutions has allowed him to refine his skills and contribute significantly to the field of integrated circuit testing.
Collaborations
Cong Xu has collaborated with notable colleagues, including Feng Yu and Stephen E Saddow. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.
Conclusion
Cong Xu's work in integrated circuit testing exemplifies the spirit of innovation in technology. His patented systems and methods are paving the way for advancements in the testing of electronic devices.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile