The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2025
Filed:
Oct. 26, 2023
University of South Florida, Tampa, FL (US);
Global Ets, Llc, Odessa, FL (US);
Stephen Saddow, Tampa, FL (US);
Cong Xu, Odessa, FL (US);
Feng Yu, Odessa, FL (US);
Liwei Xu, Odessa, FL (US);
Yunghsiao Chung, Odessa, FL (US);
UNIVERSITY OF SOUTH FLORIDA, Tampa, FL (US);
GLOBAL ETS, LLC, Odessa, FL (US);
Abstract
Systems and methods of testing integrated circuits independent of chip package configuration include or utilize a socket configured to receive a device under test (DUT), wherein the socket includes a plurality of input pins and a plurality of output pins, and wherein the DUT includes a plurality of device pins; a wireless communication device configured to wirelessly transmit information on the DUT to a server device operating a machine learning (ML) model, and wirelessly receive response data generated by the ML model from the server device, the response data including at least one of a pin configuration information of the DUT or a timing configuration information of the DUT; and a switch array configured to route respective ones of the plurality of device pins to corresponding ones of the plurality of output pins based on the response data.