Austin, TX, United States of America

Clayton Duvall

This inventor holds 1 USPTO granted patent. Top assignee: Troux Technologies. Active years: 2010.


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 27(Granted Patents)


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: Clayton Duvall: Innovator in Impact Analysis Systems

Introduction

Clayton Duvall is a notable inventor based in Austin, TX (US). He has made significant contributions to the field of enterprise architecture through his innovative patent. His work focuses on understanding the impact of assets within complex systems.

Latest Patents

Duvall holds a patent titled "Method and system for impact analysis using a data model." This patent discloses systems and methods for determining the impact of an asset on an enterprise architecture using a data model. The systems and methods allow for the assessment of not only direct dependencies but also indirect dependencies of assets. By utilizing a data model, dependency chains can be discovered, and a comprehensive dependency map can be created. The impact ratings associated with relationships between components enable the determination of the overall impact of a component on both individual components and the environment. Additionally, these systems facilitate the assessment of risk associated with specific components.

Career Highlights

Duvall is currently employed at Troux Technologies, where he applies his expertise in impact analysis. His innovative approach has positioned him as a key player in the development of systems that enhance enterprise architecture understanding.

Collaborations

Some of Duvall's coworkers include Eric Maginniss and Brandon Stewart. Their collaborative efforts contribute to the advancement of technologies in the field.

Conclusion

Clayton Duvall's work in impact analysis systems showcases his innovative spirit and dedication to improving enterprise architecture. His contributions are valuable to the ongoing evolution of technology in this domain.

Profile summary based on public USPTO records.
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