The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2010

Filed:

Aug. 05, 2005
Applicants:

Clayton Duvall, Austin, TX (US);

Eric Maginniss, Round Rock, TX (US);

Brandon Stewart, Austin, TX (US);

Inventors:

Clayton Duvall, Austin, TX (US);

Eric Maginniss, Round Rock, TX (US);

Brandon Stewart, Austin, TX (US);

Assignee:

Troux Technologies, Austin, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods for determining the impact of an asset on an enterprise architecture using a data model are disclosed. These systems and methods may determine the impact of a particular asset on the enterprise architecture represented by the data model, where determination of the impact of any particular asset takes into account not only assets that depend directly on that particular asset, but assets that depend indirectly on that asset as well. Using the data model of the enterprise architecture, dependency chains for one or more components of the data model can be discovered and a dependency map created. Using impact ratings associated with relationships between components in the dependency chains of a particular component, the impact of that particular component both on another individual component, and aggregately on an environment, can be determined. These systems and methods may also allow the determination of the risk of a particular component.


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