Rosu, Romania

Ciprian-Ionut Florea

This inventor holds 1 USPTO granted patent. Top assignee: Infineon Technologies Ag. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ciprian-Ionut Florea. Retrieved from https://idiyas.com/inventor/ciprian-ionut-florea

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Ciprian-Ionut Florea: Semiconductor Degradation Monitoring

Introduction

Ciprian-Ionut Florea is an inventor based in Rosu, Romania. His patent work concerns monitoring degradation in semiconductor devices, with a focus on detecting material degradation at interface channels.

Latest Patents

Florea is associated with 1 patent, titled “Circuits and Systems for Monitoring Degradation of One or More Interface Channels of a Semiconductor Device Using a Degradation Monitoring Circuit That Includes an Electrical Sensor.” The disclosed system uses an electrical sensor to generate a signal corresponding to one or more interface channels between a semiconductor device’s source and drain terminals. A monitoring circuit analyzes that signal to determine whether material degradation is present and outputs information indicating its status.

Career Highlights

Florea is associated with Infineon Technologies AG, a semiconductor company. His patent reflects work on monitoring semiconductor-device reliability by identifying degradation at interface channels.

Collaborations

Florea’s listed coworker is Cristian Mihai Boianceanu. Their shared professional association connects them through work related to semiconductor technology.

Conclusion

Ciprian-Ionut Florea’s patent focuses on sensing and reporting material degradation in semiconductor interface channels, contributing to the broader effort to monitor device reliability.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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