Circuits and systems for monitoring degradation of one or more interface channels of a semiconductor device using a degradation monitoring circuit that includes an electrical sensor

Abstract

A system includes a semiconductor device that includes a source terminal, a drain terminal, and an interface layer between the source terminal and the drain terminal, the interface layer including a plurality of interface channels. The system also includes a degradation monitoring circuit that includes an electrical sensor, wherein the degradation monitoring circuit is configured to: generate, using the electrical sensor, a sensor signal corresponding to one or more interface channels of the plurality of interface channels; determine, based on the sensor signal, whether a degradation of a material is present at the one or more interface channels of the plurality of interface channels; and output information indicating whether the degradation of the material is present at the one or more interface channels of the plurality of interface channels.