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Chusuke Munakata

USPTO Granted Patents = 13

Average Co-Inventor Count = 2.8

ph-index = 9

Forward Citations = 268(Granted Patents)

Location History:

Nishitama, JP (1986 - 1989)
Tokyo, JP (1984 - 1993)

Company Filing History:

13 out of 42,496

Years Active: 1984-1993

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13 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 5252719 - Process for preparing protein-oriented membrane (1993-10-12),

2. 5140272 - Method of semiconductor surface measurment and an apparatus for (1992-08-18),

3. 4876458 - Apparatus for measuring particles in liquid (1989-10-24),

4. 4827143 - Monitor for particles of various materials (1989-05-02),

5. 4791288 - Scanning photon microscope for simulataneously displaying both the (1988-12-13),

6. 4767211 - Apparatus for and method of measuring boundary surface (1988-08-30),

7. 4733063 - Scanning laser microscope with aperture alignment (1988-03-22),

8. 4731855 - Pattern defect inspection apparatus (1988-03-15),

9. 4672578 - Method of information recording on a semiconductor wafer (1987-06-09),

10. 4581578 - Apparatus for measuring carrier lifetimes of a semiconductor wafer (1986-04-08),

11. 4563642 - Apparatus for nondestructively measuring characteristics of a (1986-01-07),

12. 4464627 - Device for measuring semiconductor characteristics (1984-08-07),

13. 4453181 - Scanning-image forming apparatus using photo response signal (1984-06-05),

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