Chunxiao Liu

Title: Chunxiao Liu and Three-Dimensional Feature Analysis

Introduction

Chunxiao Liu is an inventor associated with Shandong, China. Her patent work includes a method and system for analyzing three-dimensional features in a sample.

Latest Patents

Liu is associated with 1 patent: “Method and System for Analyzing Three-Dimensional Features.” The invention analyzes multiple features using images of two sample surfaces. The first image shows feature cross-sections at the first surface, while the second image shows corresponding cross-sections at different depths. The second surface is created by milling away at least part of the first surface. By comparing the cross-sections in both images, the method constructs a three-dimensional model of the features.

Career Highlights

The provided information associates Liu with Fei Company. Her patent describes an approach to reconstructing three-dimensional features from images captured at different sample depths.

Collaborations

Bingxing Wu and Zhenxin Zhong are identified as Liu’s coworkers. The available information does not specify their roles in the patent or their particular contributions.

Conclusion

Chunxiao Liu’s listed patent focuses on using image comparisons across milled sample surfaces to build three-dimensional models, highlighting her work in feature analysis.