Hangzhou, China

Chungchiang Lin

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Hangzhou Hfc Semiconductor Co.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chungchiang Lin. Retrieved from https://idiyas.com/inventor/chungchiang-lin

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Chungchiang Lin and Semiconductor Device Innovation.

Introduction

Chungchiang Lin is an inventor based in Hangzhou, China, associated with Hangzhou HFC Semiconductor Co. His listed patent concerns an nFET device and a method for fabricating it.

Latest Patents

Lin is credited with 1 patent: “nFET Device and Method for Fabricating Same.” The disclosed method forms a phosphorus-doped epitaxial silicon layer, then uses secondary phosphorus ion implantation and laser annealing to create a heavily phosphorus-doped epitaxial silicon layer. This layer is 20 to 30 nanometers thick and contains trisilicon tetraphosphide (Si₃P₄), which has a smaller lattice constant than silicon.

Career Highlights

The patent describes a semiconductor fabrication approach that combines epitaxy, ion implantation, and laser annealing to produce a phosphorus-rich layer for an nFET device. The available information identifies Lin’s association with Hangzhou HFC Semiconductor Co., but does not provide further details about his career.

Collaborations

Pengpeng Wang and Haijiang Yuan are identified as Lin’s coworkers. The available information does not specify their roles in the patent.

Conclusion

Chungchiang Lin’s listed patent focuses on a specialized process for forming a heavily phosphorus-doped layer in an nFET, highlighting his documented contribution to semiconductor device fabrication.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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