Chu-Pei, Taiwan

Chung-Ray Chen

This inventor holds 1 USPTO granted patent. Top assignee: Taiwan Semiconductor Manufacturing Comp. Ltd.. Active years: 2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chung-Ray Chen. Retrieved from https://idiyas.com/inventor/chung-ray-chen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: Innovations by Chung-Ray Chen

Introduction

Chung-Ray Chen is a notable inventor based in Chubei, Taiwan. He has made significant contributions to the field of semiconductor manufacturing, particularly through his innovative patent related to cleaning processes.

Latest Patents

Chung-Ray Chen holds a patent for a "Cleaning container and method for cleaning LP furnace thermocouple sleeves." This invention involves a cleaning container designed for chemically cleaning elongated members, including quartz thermocouple sleeves. The patent describes a first body member and a second body member that form a combined containing space for sealably holding a cleaning solution. The design includes various sealing mechanisms to ensure effective cleaning.

Career Highlights

Chung-Ray Chen is associated with Taiwan Semiconductor Manufacturing Company Limited, a leading firm in the semiconductor industry. His work has contributed to advancements in manufacturing processes, enhancing efficiency and effectiveness in cleaning thermocouple sleeves.

Collaborations

Chung-Ray Chen has collaborated with notable coworkers, including Yung-Pin Lin and Chen-Mei Fan. Their teamwork has fostered innovation and development within their projects.

Conclusion

Chung-Ray Chen's contributions to the field of semiconductor manufacturing through his innovative patent demonstrate his commitment to advancing technology. His work continues to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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