This inventor holds 1 USPTO granted patent. Top assignee: National Science Council. Active years: 2000.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2000
Title: Innovations of Chung-Min Lee: Pioneering Optical Wavefront Analysis
Introduction
Chung-Min Lee is a notable inventor based in Taipei, Taiwan, recognized for his significant contribution to the field of optical measurement. As a dedicated innovator, he has developed a patented technology that enhances the accuracy and reliability of wavefront analysis.
Latest Patents
Chung-Min Lee holds a patent for an "Optical wavefront analyzer and method using a single wave shifter." This invention represents a substantial advancement in measuring the wavefront of a light beam through a phase-shearing interferometry technique. The optical wavefront analyzer comprises several key components including a single phase shifter, a driving device, a pattern receiving device, and a phase reconstructing device. The method developed addresses challenges faced in traditional optical wavefront measurement by employing phase-shearing and phase-shifting techniques. Notably, it resolves issues related to two-axial focusing and phase inconsistencies, enhancing measurement efficacy with a non-iterative, path-independent unwrapping methodology for complex wavefronts.
Career Highlights
Chung-Min Lee has established his career at the National Science Council, where he continues to contribute to innovative research in optical technologies. His work is characterized by a commitment to pushing the boundaries of optical science for practical applications.
Collaborations
Throughout his career, Chung-Min Lee has collaborated with esteemed colleagues, including Yi-Chun Chen and Shu-Sheng Lee. These collaborations have fostered an environment of shared knowledge and expertise, leading to further advancements in optical wavefront analysis and similar fields.
Conclusion
Chung-Min Lee's work exemplifies the spirit of innovation in the realm of optical measurement. His patented technology not only addresses critical challenges in the field but also serves as a testament to the importance of collaborative research in driving progress. As he continues his endeavors at the National Science Council, the impact of his inventions on the scientific community and beyond remains promising.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile