The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2000
Filed:
Jan. 22, 1999
Yi-Chun Chen, Keelung, TW;
Shu-Sheng Lee, Taipei, TW;
Chung-Min Lee, Taipei, TW;
Ching-Wei Chen, Taipei, TW;
Heui-Yung Chang, Taipei, TW;
Gym-Bin Yeh, Taipei, TW;
Chih-Kung Lee, Taipei, TW;
Shih-Tsong Lin, Taipei, TW;
Chi-Tang Hsieh, Taipei Hsein, TW;
Wei-Liang Chen, Taoyuan Hsein, TW;
National Science Council, Taipei, TW;
Abstract
An optical wavefront analyzer based on the phase-shearing interferometry technique for measuring a wavefront of a light beam is disclosed. The analyzer includes a single phase shifter, a driving device, a pattern receiving device, and a phase reconstructing device. A method of measuring a wavefront of a light beam is also provided for solving the problems of two-axial focusing and phase inconsistency encountered the prior art by employing phase-shearing and phase-shifting techniques to improve the method of optical wavefront mesurement. A non-iterative, path-independent unwrapping methodology is used to deal with a complicated wavefront.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile