Taipei, Taiwan

Chun-Yu Liu

This inventor holds 2 USPTO granted patents and 1 published patent application. Top assignees: Industrial Technology Research Institute, Ubiik Inc.. Active years: 2022-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chun-Yu Liu. Retrieved from https://idiyas.com/inventor/chun-yu-liu-5w82k309

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 2 

% Patents Active = 100.0

Average Co-Inventor Count = 3.4

ph-index = 1


Company Filing History:


Years Active: 2022-2025

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2 patents (USPTO):Explore Patents

Title: Innovations of Chun-Yu Liu

Introduction

Chun-Yu Liu is a notable inventor based in Taipei, Taiwan. He has made significant contributions to the field of nanotechnology and advanced metering systems. With a total of 2 patents, Liu's work showcases his expertise and innovative spirit.

Latest Patents

Liu's latest patents include a "Method for determining parameters of three-dimensional nanostructure and apparatus applying the same." This method involves obtaining an X-ray reflection intensity measurement curve of a nanostructure and comparing it with a standard curve to determine various parameters of the nanostructure. His second patent, "Data concentration apparatus and system for advanced metering," describes a system that includes a data concentration device and a data acquiring device, enabling efficient data transmission and communication.

Career Highlights

Throughout his career, Chun-Yu Liu has worked with prominent organizations such as Ubiik Inc. and the Industrial Technology Research Institute. His experience in these companies has allowed him to develop and refine his innovative ideas.

Collaborations

Liu has collaborated with talented individuals, including Fabien Petitgrand and Tien-Haw Peng, further enhancing his work and contributions to the field.

Conclusion

Chun-Yu Liu's innovative patents and career achievements highlight his significant role in advancing technology in nanostructures and metering systems. His work continues to inspire future innovations in these fields.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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