Chun-Yi Lee

Title: Innovations of Inventor Chun-Yi Lee

Introduction

Chun-Yi Lee is a notable inventor based in Chiayi, Taiwan. He has made significant contributions to the field of non-contact detection technologies. With a total of 3 patents to his name, his work showcases innovative methods and systems that enhance detection accuracy.

Latest Patents

One of his latest patents is a non-contact detection device and detection method. This method involves photographing a nut to obtain a threaded hole image. A comparison is then made between the threaded hole image and a standard threaded hole image. The area difference obtained from this comparison determines whether the nut is a good nut.

Another significant patent is a phase shift-based three-dimensional measurement system with multiple calibration surfaces. This system includes a projection device, a camera, and a processor. The projection device projects structural light onto a reference object with calibration surfaces. The camera captures images of the reference object, and the processor decodes these images to obtain phase data. This data is used to compute a phase-height conversion parameter, enhancing measurement accuracy.

Career Highlights

Chun-Yi Lee is associated with the Industrial Technology Research Institute, where he continues to develop innovative technologies. His work has been instrumental in advancing non-contact detection methods, which have applications in various industries.

Collaborations

Chun-Yi Lee collaborates with talented individuals such as Tsai-Ling Kao and Jhe-Ruei Li. Their combined expertise contributes to the success of their projects and innovations.

Conclusion

Chun-Yi Lee's contributions to non-contact detection technologies and three-dimensional measurement systems highlight his innovative spirit and dedication to advancing technology. His patents reflect a commitment to improving detection methods, making a significant impact in his field.