Hualien, Taiwan

Chun Yi Chen

This inventor holds 1 USPTO granted patent. Top assignee: Taiwan Semiconductor Manufacturing Comp. Ltd.. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chun Yi Chen. Retrieved from https://idiyas.com/inventor/chun-yi-chen-ee7ibvy6

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: Innovations by Chun Yi Chen

Introduction

Chun Yi Chen is a notable inventor based in Hualien, Taiwan. She has made significant contributions to the field of semiconductor manufacturing. Her innovative approach has led to the development of a unique patent that addresses manufacturing challenges.

Latest Patents

Chun Yi Chen holds a patent titled "Method and system for problem case packaging." This invention involves a method of handling manufacturing problem information related to semiconductor products. The process includes collecting problem information from various entities involved in fabrication and organizing it into problem cases stored in a database. Each case represents a specific manufacturing issue and is linked to relevant information.

Career Highlights

Chun Yi Chen is currently employed at Taiwan Semiconductor Manufacturing Company Ltd. Her work focuses on improving manufacturing processes and enhancing efficiency in semiconductor production. With her expertise, she has contributed to advancements in the industry.

Collaborations

Chun Yi Chen has collaborated with esteemed colleagues, including Wen-Chang Kuo and Chien-Chung Huang. These partnerships have fostered innovation and have been instrumental in the development of her patent.

Conclusion

Chun Yi Chen's contributions to semiconductor manufacturing through her patent demonstrate her commitment to innovation and problem-solving in the industry. Her work continues to influence the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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