Chun-Wei Lo

Introduction

Chun-Wei Lo, an accomplished inventor located in Taichung, Taiwan, has made significant contributions to the field of measurement systems and artificial intelligence. With a total of six patents to his name, he has established himself as a notable figure in innovative technologies.

Latest Patents

His latest inventions showcase his expertise in measurement and AI training. One of his patents involves a measurement system and method that includes an excitation light source, an image sensor, and a calculator. This innovative system allows for the analysis of a 3D geometric-structure image of vias in a glass substrate through 2D interference patterns. Another significant patent is the method of training AI for label-free cell viability determination. This method outlines a process involving the use of fluorescence and DHM images to train AI for accurately assessing cell viability without the need for labeling.

Career Highlights

Chun-Wei Lo is currently affiliated with the Industrial Technology Research Institute, where he continues to excel in research and innovation. His work is characterized by a strong emphasis on developing cutting-edge technologies that enhance measurements and improve the viability assessment of cell samples.

Collaborations

Throughout his career, Chun-Wei has collaborated with talented professionals, including Chung-Lun Kuo and Yi-Sha Ku. These partnerships have contributed to the advancement of his research and the successful development of his patented technologies.

Conclusion

Chun-Wei Lo stands out as a significant contributor to the fields of measurement systems and artificial intelligence. His six patents reflect his innovative mindset and dedication to advancing technology, making him a respected inventor within the scientific community.