This inventor holds 1 USPTO granted patent. Top assignee: Taiwan Semiconductor Manufacturing Comp. Ltd.. Active years: 2003.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2003
Title: Innovations of Chun-Hong Chang in Electroplating Technology.
Introduction
Chun-Hong Chang is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of electroplating technology, particularly through his innovative methods that enhance the uniformity of electroplated layers.
Latest Patents
Chun-Hong Chang holds a patent for a "Selective electroplating method employing annular edge ring cathode electrode contact." This patent describes a method for forming a patterned photoresist layer and an electroplated patterned conductor layer. The process begins with a substrate, over which a blanket photoresist layer made of negative photoresist material is formed. The blanket photoresist layer is then photoexposed using a specialized apparatus that includes an annular edge ring exclusion mechanism. This innovative approach results in a patterned photoresist layer that enhances the thickness uniformity of the electroplated conductor layer.
Career Highlights
Chun-Hong Chang is currently employed at Taiwan Semiconductor Manufacturing Company Limited, where he continues to develop and refine his innovative techniques in semiconductor manufacturing. His work has been instrumental in advancing the capabilities of electroplating processes within the industry.
Collaborations
Chun-Hong Chang has collaborated with esteemed colleagues such as Kai-Ming Ching and Sheng-Liang Pan. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.
Conclusion
Chun-Hong Chang's contributions to electroplating technology exemplify the impact of innovative thinking in the semiconductor industry. His patent and ongoing work continue to influence advancements in manufacturing processes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile