This inventor holds 2 USPTO granted patents. Top assignee: Hangzhou Dianzi University. Active years: 2024-2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2024-2026
Title: Innovations of Chuanyong Wang in Quality Detection of Porous Metal Materials
Introduction
Chuanyong Wang is an accomplished inventor based in Hangzhou, China. He has made significant contributions to the field of material science, particularly in the quality detection of porous metal materials. His innovative approach has the potential to enhance the accuracy of quality assessments in various applications.
Latest Patents
Wang holds a patent for a quality detection method for porous metal material. This method involves acquiring a sectional image of the material and converting it into a grayscale image. It further includes obtaining shadow regions of pore areas and calculating a correction weight value to determine a first qualification index. The method also involves determining a pore diameter distribution uniformity index and a second qualification index based on this distribution. Ultimately, it evaluates the quality of the porous metal material using these indices, thereby improving the accuracy of quality detection results.
Career Highlights
Chuanyong Wang is affiliated with Hangzhou Dianzi University, where he contributes to research and development in material science. His work focuses on innovative methods that enhance the quality assessment processes in engineering and manufacturing.
Collaborations
Wang collaborates with Yating Wan, a fellow researcher, to further explore advancements in quality detection methods and their applications in various industries.
Conclusion
Chuanyong Wang's contributions to the field of quality detection for porous metal materials exemplify the importance of innovation in material science. His patented method not only improves detection accuracy but also paves the way for future advancements in the industry.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile