The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2024
Filed:
Sep. 23, 2023
Hangzhou Dianzi University, Hangzhou, CN;
Chuanyong Wang, Hangzhou, CN;
Yating Wan, Hangzhou, CN;
HANGZHOU DIANZI UNIVERSITY, Hangzhou, CN;
Abstract
A quality detection method for porous metal material is provided, and the method includes: acquiring a sectional image of a porous metal material, converting the sectional image to a grayscale image; obtaining a shadow region of each of pore regions and a correction weight value of the shadow region to determine a first qualification index; acquiring an optimal preset clustering K value, and determining a pore diameter distribution uniformity index, and determining a second qualification index based on the pore diameter distribution uniformity index; determining a quality evaluation index of the porous metal material based on the first qualification index and the second qualification index; and determining whether quality of the porous metal material is qualified based on the quality evaluation index. The method realizes the quality detection of the porous metal material and effectively improves the accuracy of the quality detection result of the porous metal material.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile