This inventor holds 1 USPTO granted patent. Top assignee: Zhejiang University. Active years: 2021.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2021
Title: Innovations by Chuanyong Wang
Introduction
Chuanyong Wang is a notable inventor based in Zhejiang, China. He has made significant contributions to the field of optical inspection technology. His work focuses on developing methods and devices that enhance the quality inspection of optical elements.
Latest Patents
One of his key patents is titled "Device and method for simultaneously inspecting defects of surface and subsurface of optical element." This invention provides a device and method that utilize laser-induced ultrasound and laser scattering inspection technologies. By generating acoustic sound waves on the surface and subsurface of an optical element, the invention allows for the observation and analysis of subsurface defects. The inspection process involves analyzing amplitude and phase changes of scattered light intensity and reflected light intensity. This innovative approach is particularly beneficial for quality inspection of ultra-precise optical elements, which have strict requirements regarding subsurface defects. Chuanyong Wang holds 1 patent for this invention.
Career Highlights
Chuanyong Wang is affiliated with Zhejiang University, where he contributes to research and development in optical technologies. His expertise in the field has positioned him as a valuable asset in advancing optical inspection methods.
Collaborations
He has collaborated with notable colleagues, including Huilin Du and Bingfeng Ju, to further enhance the research and development of optical inspection technologies.
Conclusion
Chuanyong Wang's innovative work in optical inspection technology demonstrates his commitment to advancing the field. His contributions are essential for improving the quality of optical elements, particularly in high-precision applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
