Chuanqi Shi

Title: Innovations by Chuanqi Shi in Semiconductor Testing Technologies

Introduction

Chuanqi Shi is a prominent inventor based in Hefei, China, known for his contributions to semiconductor device testing technologies. With a total of five patents to his name, he has made significant advancements in methods for testing memory and control chips.

Latest Patents

One of his latest patents is titled "Method for testing memory by built-in self-test storage space and related device." This invention provides a memory test method executed by a built-in self-test circuit. The method involves acquiring defect information of a first memory, obtaining repair information based on that defect information, and storing the repair information in a second memory. Another notable patent is the "Test method for control chip and related device." This invention relates to a test method and apparatus for a control chip, which includes a built-in self-test BIST circuit. The method enhances test efficiency by reading first test vectors from a target memory chip and acquiring test results based on the output information from the control chip.

Career Highlights

Chuanqi Shi is currently employed at Changxin Memory Technologies, Inc., where he continues to innovate in the field of semiconductor technologies. His work focuses on improving testing methods that enhance the reliability and efficiency of memory and control chips.

Collaborations

He collaborates with notable colleagues such as Heng-Chia Chang and Li Ding, contributing to a dynamic research environment that fosters innovation.

Conclusion

Chuanqi Shi's work in semiconductor testing technologies exemplifies the impact of innovative methods on the industry. His patents not only advance technical capabilities but also pave the way for future developments in the field.