Everett, WA, United States of America

Christopher W Lagerberg

This inventor holds 2 USPTO granted patents. Top assignee: Fluke Electronics Corporation. Active years: 2018-2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Christopher W Lagerberg. Retrieved from https://idiyas.com/inventor/christopher-w-lagerberg-jitx91ri

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 2

Forward Citations = 39(Granted Patents)


Company Filing History:


Years Active: 2018-2019

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2 patents (USPTO):Explore Patents

Title: The Innovations of Christopher W. Lagerberg

Introduction

Christopher W. Lagerberg is an accomplished inventor based in Everett, WA (US). He has made significant contributions to the field of sensor technology, holding two patents to his name. His work is primarily associated with Fluke Electronics Corporation, a leader in electronic test tools and software.

Latest Patents

Lagerberg's latest patents include an innovative design for an enclosure for the main unit of voltage, current, or temperature sensors. This invention aims to enhance the durability and functionality of sensor devices, making them more reliable in various applications.

Career Highlights

Throughout his career, Lagerberg has demonstrated a commitment to advancing technology in the electronics sector. His role at Fluke Electronics Corporation has allowed him to work on cutting-edge projects that push the boundaries of sensor technology.

Collaborations

Lagerberg has collaborated with notable colleagues, including Jeffrey M. Elrod and Duncan Nigel Kearsley. These partnerships have fostered a creative environment that encourages innovation and the development of new ideas.

Conclusion

Christopher W. Lagerberg's contributions to sensor technology through his patents and work at Fluke Electronics Corporation highlight his role as a significant inventor in the field. His innovative spirit continues to inspire advancements in electronic testing and measurement.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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