Company Badge
USPTO Data Jan 1 1976 - Oct 20 2026
9 Patents
#14 in Everett, WA
#755 in Washington
#32,605 in US
Fluke Electronics Corporation
Forward Citations = 80
20 inventors:
Everett, WA, United States of America
Fluke Electronics Corporation
EPO Patents = 2
Trademarks = 6
Forward Citations = 80
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20 inventors (with patents filed for the assignee):
Jeffrey M Elrod (4 out of 27 patents)
Duncan Nigel Kearsley (2 out of 18 patents)
Aaron Laho (2 out of 4 patents)
4. Christopher W Lagerberg (2 out of 2 patents)
5. Ferdinand Y Laurino (1 out of 55 patents)
6. Cy Kawasaki (1 out of 3 patents)
7. Sidney Siang Lin (1 out of 5 patents)
8. Malcolm Charles Brown (1 out of 2 patents)
9. Keith Norman McMann (1 out of 1 patent)
10. Wayne S Hoofnagle (1 out of 42 patents)
11. Terry G Morey (1 out of 7 patents)
12. Robert Maannao (1 out of 1 patent)
13. John Wesley Hyacinthe (1 out of 7 patents)
14. Bruce Spiegel (1 out of 1 patent)
15. Paul Herman Heydron (1 out of 16 patents)
9 patents:
Company Overview
Fluke Electronics Corporation is a leading provider of electronic testing equipment and measurement tools. With a history dating back over 70 years, Fluke is known for its innovative products and solutions that help professionals in various industries ensure the safety, quality, and performance of their work. From multimeters and thermal imagers to power quality analyzers and infrared cameras, Fluke's products are trusted by technicians, engineers, and maintenance professionals around the world.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Fluke Electronics Corporation. Retrieved from https://idiyas.com/company/fluke-electronics
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
2 patents (EPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]