Socorro, NM, United States of America

Christopher L Carilli

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Assoicated Universties, Inc.. Active years: 2024.

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Innovations by Christopher L Carilli

Introduction

Christopher L Carilli is an accomplished inventor based in Socorro, NM (US). He has made significant contributions to the field of geometric tools and methods for image analysis. His innovative approach focuses on enhancing feature recognition in interferometric images.

Latest Patents

Christopher L Carilli holds 1 patent for his invention titled "Geometric tools and methods to measure closure phase for robust feature recognition in interferometric images." This patent discloses methods and systems designed to eliminate corrupting influences caused by the propagation medium and the data capture devices themselves. The method involves obtaining image-plane data using multiple data capture devices, measuring the closure phase geometrically, and removing corruptions from the image features to output uncorrupted morphological features of the target object.

Career Highlights

Christopher is associated with Associated Universities, Inc., where he applies his expertise in developing advanced imaging techniques. His work has been instrumental in improving the accuracy and reliability of image analysis in various applications.

Collaborations

One of his notable collaborators is Nithyanandan Thyagarajan, with whom he has worked on various projects to enhance the capabilities of image processing technologies.

Conclusion

Christopher L Carilli's innovative contributions to the field of image analysis demonstrate his commitment to advancing technology through his patents and collaborative efforts. His work continues to influence the development of robust feature recognition methods in interferometric imaging.

Profile summary based on public USPTO records.
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