The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2024
Filed:
Jul. 09, 2021
Associated Universities, Inc., Washington, DC (US);
Nithyanandan Thyagarajan, Myaree, AU;
Christopher L. Carilli, Socorro, NM (US);
Associated Universities, Inc., Washington, DC (US);
Abstract
Methods and systems of eliminating corrupting influences caused by the propagation medium and the data capture devices themselves from useful image features or characteristics such as the degree of symmetry are disclosed. The method includes the steps of obtaining image-plane data using a plurality of data capture devices, wherein the image-plane data is a combined visibility from each of the data capture devices, measuring the closure phase geometrically in the image-plane directly from the image-plane, removing the corruptions from the image features based on the measured closure phase to remove the non-ideal nature of the measurement process, and outputting the uncorrupted morphological features of the target object in the image.