Christopher J LeBeau

This inventor holds 15 USPTO granted patents and 1 published patent application, primarily in Semiconductor Inspection. Top assignee: Motorola Corporation. Active years: 1989-2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Christopher J LeBeau. Retrieved from https://idiyas.com/inventor/christopher-j-lebeau

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

USPTO Granted Patents = 15 (Patent Applications = 1)

% Patents Active = 100.0

Average Co-Inventor Count = 1.5

ph-index = 9

Forward Citations = 286(Granted Patents)

Company Filing History:

15 out of 20,290

Motorola Corporation

patents

Years Active: 1989-2002

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Areas of Expertise:

Defect Detection

Lead Coplanarity

Wafer Inspection

Bond Integrity

Image Acquisition

Emissive Display

Thermal Inspection

Light Diffuser

Automatic Inspection

Semiconductor Packaging

Visual Inspection

15 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 6404912 - Method and apparatus for visually inspecting an object (2002-06-11),

2. 6160906 - Method and apparatus for visually inspecting an object (2000-12-12),

3. 6128404 - Method of detecting defects in semiconductor package leads (2000-10-03),

4. 6009187 - Wafer prober having an emissive display inspection system and method of (1999-12-28),

5. 5982493 - Apparatus and method for acquiring multiple images (1999-11-09),

6. 5563703 - Lead coplanarity inspection apparatus and method thereof (1996-10-08),

7. 5452368 - Method of detecting defects in semiconductor package leads (1995-09-19),

8. 5246291 - Bond inspection technique for a semiconductor chip (1993-09-21),

9. 5212390 - Lead inspection method using a plane of light for producing reflected (1993-05-18),

10. 5204910 - Method for detection of defects lacking distinct edges (1993-04-20),

11. 5201841 - Thermal delay non-destructive bond integrity inspection (1993-04-13),

12. 5137362 - Automatic package inspection method (1992-08-11),

13. 5129009 - Method for automatic semiconductor wafer inspection (1992-07-07),

14. 5115475 - Automatic semiconductor package inspection method (1992-05-19),

15. 4844576 - Light diffuser (1989-07-04),

Title: Innovations by Christopher J LeBeau

Introduction

Christopher J LeBeau is a notable inventor based in Tempe, AZ, who has made significant contributions to the field of technology. With a total of 15 patents to his name, he has demonstrated a strong commitment to innovation and problem-solving. His work primarily focuses on methods and apparatuses for visually inspecting objects, showcasing his expertise in engineering and design.

Latest Patents

Among his latest patents is a method and apparatus for visually inspecting an object. This invention involves a pickup tool equipped with reflective surfaces that facilitate the inspection process. The tool picks up an object and moves it over a light source, where the reflective surfaces reflect a light beam emitted from the source. This generates deflected light beams that backlight the object, forming silhouette images captured by cameras. The visual inspection of the object is then performed by analyzing these images, enhancing the accuracy and efficiency of the inspection process.

Career Highlights

Christopher J LeBeau is currently employed at Motorola Corporation, where he continues to innovate and develop new technologies. His work at Motorola has allowed him to apply his inventive skills in a corporate environment, contributing to the company's advancements in technology and product development.

Collaborations

Throughout his career, LeBeau has collaborated with talented individuals such as David Charles Lehnen and Shay-Ping T Wang. These collaborations have fostered a creative environment that encourages

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

1 patent pending: