This inventor holds 1 USPTO granted patent. Top assignee: Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung E.v.. Active years: 2009.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2009
Title: Christoph Jung: Innovator in Refractive Index Measurement
Introduction
Christoph Jung is a notable inventor based in Bayreuth, Germany. He has made significant contributions to the field of optical measurement, particularly in determining the refractive index of transparent and partially transparent layers. His innovative approach has the potential to enhance various applications in optics and materials science.
Latest Patents
Jung holds a patent for a method and device designed for three-dimensionally determining the refractive index of transparent or partially transparent layers. This invention involves irradiating the layer with polarized light at different angles of incidence and measuring variations in the light's polarization as it passes through the layer. The method is distinguished by the use of an immersion medium, allowing for highly accurate determination of the refractive index of anisotropic thin layers in all three spatial directions.
Career Highlights
Christoph Jung is associated with the Fraunhofer Gesellschaft zur Förderung der angewandten Forschung e.V., a leading research organization in applied sciences. His work has been instrumental in advancing optical measurement techniques, contributing to both academic research and practical applications.
Collaborations
Jung has collaborated with notable colleagues such as Joachim Stumpe and Olga Kulikovska, enhancing the scope and impact of his research through teamwork and shared expertise.
Conclusion
Christoph Jung's innovative methods for measuring refractive indices represent a significant advancement in optical technology. His contributions continue to influence the field and pave the way for future developments in materials science.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
