The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2009
Filed:
Jun. 01, 2004
Joachim Stumpe, Nauen, DE;
Christoph Jung, Bayreuth, DE;
Olga Kulikovska, Berlin, DE;
Abstract
The present invention relates to a method and a device for three-dimensionally determining the refractive index and, if necessary, the layer thickness of transparent or partially transparent layers in which the layer () is irradiated at different angles of incidence () with polarised light, and variations in the polarisation of the light are measured and evaluated as the light passes through the layer (). The method is characterized in that the measurement is carried out through an immersion medium () between which the layer () is inserted. A highly accurate determination of the refractive index of anisotropic thin layers in all three spatial directions is made possible by this method.