Company Filing History:
Years Active: 2014-2015
Title: Christoph Jablonski: Innovator in X-ray Detection Technology
Introduction
Christoph Jablonski is a prominent inventor based in Berlin, Germany. He has made significant contributions to the field of X-ray detection technology. With a total of 3 patents to his name, Jablonski's work has advanced the capabilities of multi-pixel X-ray detectors.
Latest Patents
One of Jablonski's latest patents is a method and device for detecting X-ray quanta. This innovative method involves a multi-pixel X-ray detector that features a two-dimensional matrix of measurement-signal-generating pixels. The detector is designed as a direct solid-state detector, where pixels generating measurement signals within a specific time interval are grouped into event clusters. This allows for precise approximation of the interaction position of X-ray quanta with the detector. Another notable patent is a method for obtaining X-ray spectrum information about pixels arranged in a grid pattern. This method utilizes a conventional X-ray detector equipped with photodiodes and scintillator material, enabling the extraction of energy information from individual X-ray quanta during read-out operations.
Career Highlights
Christoph Jablonski is currently employed at Siemens Aktiengesellschaft, a leading company in the field of technology and engineering. His work at Siemens has allowed him to focus on developing advanced X-ray detection systems that enhance imaging capabilities in medical and industrial applications.
Collaborations
Throughout his career, Jablonski has collaborated with notable colleagues such as Franz Atzinger and Gerhard Hahm. These collaborations have contributed to the successful development of innovative technologies in the field of X-ray detection.
Conclusion
Christoph Jablonski is a key figure in the advancement of X-ray detection technology, with several patents that reflect his innovative spirit. His contributions continue to impact the field positively, enhancing the capabilities of X-ray imaging systems.