Siemens Aktiengesellschaft

Christoph Jablonski

Bernhard Sandkamp

Markus Schild

Franz Atzinger

Gerhard Hahm

Michael Stark

Fabian Wloka

Carsten Illenseer

Raphael Henrich

A method is provided for detecting x-ray quanta incident on a multi-pixel x-ray detector having a two-dimensional matrix composed of measurement-signal-generating pixels, wherein the multi-pixel x-ray detector is embodied as a direct solid-state detector, wherein the pixels, which generate a measurement signal within a predefined time interval and which in addition lie in a contiguous cluster composed of a plurality of pixels, are assigned to an event cluster by an evaluation unit and wherein their measurement signals are drawn upon for the purpose of approximating the position at which the x-ray quantum interacted with the multi-pixel x-ray detector.

Method and device for detecting x-ray quanta

An X-ray detector of conventional design having photodiodes and scintillator material arranged thereon is able, given a suitable read-out frequency matching a low dose to which the flat-panel X-ray detector is subjected, to obtain images during each read-out operation, from which images the energy of individual X-ray quanta can be derived. An item of X-ray-spectrum information about pixels in a grid pattern can be obtained thereby.

Method for obtaining an item of X-ray-spectrum information about pixels in a grid pattern

A sensor element is provided for conversion of x-radiation into an electrical measurement signal, the sensor element including an x-radiation-absorbing fluid arranged in a housing, and a pressure sensor arranged to detect a pressure of the fluid on the pressure sensor and convert the detected pressure into an electrical measurement signal. A plurality of such sensor elements may be arranged in a matrix-type arrangement to form an x-ray detector.

Sensor element and X-ray detector comprising a plurality of sensor elements

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Berlin, Germany

Christoph Jablonski