The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2015
Filed:
Oct. 24, 2012
Siemens Aktiengesellschaft, Munich, DE;
Franz Atzinger, Nuremburg, DE;
Gerhard Hahm, Erlangen, DE;
Raphael Henrich, Neunkirchen am Brand, DE;
Carsten Illenseer, Mohrendorf, DE;
Christoph Jablonski, Berlin, DE;
Bernhard Sandkamp, Erlangen, DE;
Markus Schild, Herzogenaurach, DE;
Michael Stark, Forchheim, DE;
Fabian Wloka, Erlangen, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
A method is provided for detecting x-ray quanta incident on a multi-pixel x-ray detector having a two-dimensional matrix composed of measurement-signal-generating pixels, wherein the multi-pixel x-ray detector is embodied as a direct solid-state detector, wherein the pixels, which generate a measurement signal within a predefined time interval and which in addition lie in a contiguous cluster composed of a plurality of pixels, are assigned to an event cluster by an evaluation unit and wherein their measurement signals are drawn upon for the purpose of approximating the position at which the x-ray quantum interacted with the multi-pixel x-ray detector.