Ostfildern, Germany

Christof PRUß

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Universitãt Stuttgart. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Christof PRUß. Retrieved from https://idiyas.com/inventor/christof-pruß

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

 

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Christof Pruß: Innovator in Optical Measurement Technology

Introduction

Christof Pruß is a notable inventor based in Ostfildern, Germany. He has made significant contributions to the field of optical measurement technology, particularly through his innovative patent.

Latest Patents

Pruß holds a patent for a Single Frame-Tilted Wave Interferometer. This advanced interferometer is designed for measuring the surface or optical thickness of an optically smooth test object. It illuminates the test object with multiple object waves of varying wavelengths and superimposes these deformed waves onto coherent reference waves. The resulting interferograms are then spectrally decomposed into wavelength-specific partial interferograms, enhancing measurement accuracy.

Career Highlights

Christof Pruß is affiliated with the prestigious Universität Stuttgart, where he continues to advance research in optical technologies. His work has garnered attention for its innovative approach to interferometry, which is crucial for various applications in science and industry.

Collaborations

Pruß collaborates with esteemed colleagues, including Christian Schober and David Hopp, contributing to a dynamic research environment that fosters innovation.

Conclusion

Christof Pruß exemplifies the spirit of innovation in optical measurement technology through his groundbreaking patent and collaborative efforts. His work continues to influence the field and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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