The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2025
Filed:
Nov. 22, 2021
Applicant:
Universität Stuttgart, Stuttgart, DE;
Inventors:
Christof Pruß, Ostfildern, DE;
Christian Schober, Ilsfeld, DE;
Assignee:
UNIVERSITÄT STUTTGART, Stuttgart, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02001 (2022.01); G01B 9/02 (2022.01); G01B 9/02015 (2022.01); G01M 11/00 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02007 (2013.01); G01B 9/02027 (2013.01); G01B 9/02032 (2013.01); G01M 11/005 (2013.01); G01B 9/02039 (2013.01); G01B 2290/50 (2013.01);
Abstract
An interferometer for the measurement of a surface or an optical thickness of an optically smooth test object is provided, wherein the interferometer is configured to illuminate the optically smooth test object simultaneously with a plurality of object waves, which have different wavelengths from one another, and to superimpose the object waves deformed by the illuminated test object onto coherent reference waves on an image capture device, and to spectrally decompose the interferograms resulting from the superposition into wavelength-specific partial interferograms.