This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Universitãt Stuttgart. Active years: 2025.
Company Filing History:
Years Active: 2025
Title: The Innovations of Christian Schober
Introduction
Christian Schober is an accomplished inventor based in Ilsfeld, Germany. He has made significant contributions to the field of optical measurement technology. His innovative work focuses on enhancing the precision of surface and optical thickness measurements.
Latest Patents
One of Schober's notable patents is the "Single frame-tilted wave interferometer." This invention provides an advanced interferometer designed for measuring the surface or optical thickness of optically smooth test objects. The interferometer is capable of illuminating the test object with multiple object waves of varying wavelengths simultaneously. It superimposes the deformed object waves onto coherent reference waves, which are then captured by an image capture device. The resulting interferograms are spectrally decomposed into wavelength-specific partial interferograms, allowing for precise measurements.
Career Highlights
Christian Schober is affiliated with the prestigious Universität Stuttgart, where he continues to advance his research and development efforts. His work has garnered attention for its innovative approach to optical measurement techniques.
Collaborations
Schober collaborates with several esteemed colleagues, including Christof Pruß and Christof Pruss, who contribute to his research endeavors.
Conclusion
Christian Schober's contributions to optical measurement technology exemplify the spirit of innovation. His patented interferometer represents a significant advancement in the field, showcasing his dedication to precision and excellence.