Dresden, Germany

Christian Wilde

This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignee: Heliatek Gmbh. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Christian Wilde. Retrieved from https://idiyas.com/inventor/christian-wilde

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Christian Wilde and Photovoltaic Inspection Innovation.

Introduction

Christian Wilde is an inventor associated with Dresden, Germany, and Heliatek GmbH. Her patent work focuses on inspecting photovoltaic elements through measurements of their electrical characteristics.

Latest Patents

Wilde is credited with 1 patent: “Method for Inspecting a Photovoltaic Element, and Photovoltaic Element Which Is Inspected Using Such a Method.” The invention describes a process for assessing a photovoltaic element by measuring the characteristic curves of its individual, electrically connected segments under illumination. It combines those measurements with the element’s dark characteristic curve to determine an overall characteristic curve, enabling inspection as the element or illumination device moves.

Career Highlights

Wilde’s listed patent connects her work with photovoltaic inspection technology at Heliatek GmbH. The method addresses how to evaluate a photovoltaic element using segment-level measurements without separating the segments.

Collaborations

The available information associates Wilde with Heliatek GmbH. No additional collaborators are specified in the provided details.

Conclusion

Christian Wilde’s patent describes a method for inspecting photovoltaic elements by combining dark-curve data with sequential measurements of illuminated segments.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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