The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2026
Filed:
Feb. 01, 2021
Heliatek Gmbh, Dresden, DE;
Christian Wilde, Dresden, DE;
HELIATEK GmbH, Dresden, DE;
Abstract
A method for inspecting a photovoltaic element includes providing a photovoltaic element and providing a dark characteristic curve of the photovoltaic element at a specific voltage applied to the photovoltaic element. Individual segments dividing the photovoltaic element without separation are defined. The method includes measuring characteristic curves of the individual segments of the photovoltaic element in a time sequence and illuminating the individual segments with an illumination device at the specific voltage applied to the photovoltaic element. Further, the method includes moving the photovoltaic element along a running direction relative to the illumination device and/or moving the illumination device along a running direction relative to the photovoltaic element; and ascertaining an overall characteristic curve of the photovoltaic element as a function of the dark characteristic curve and the measured characteristic curves of the individual segments, so that the photovoltaic element is able to be inspected.