This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignee: Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung E.v.. Active years: 2018.
Company Filing History:
Years Active: 2018
Title: Christian Wiede - Innovator in 2D Image Analysis
Introduction
Christian Wiede is a notable inventor based in Chemnitz, Germany. He has made significant contributions to the field of image analysis, particularly with his innovative patent for a 2D image analyzer. His work has implications in various industries, enhancing the way images are processed and analyzed.
Latest Patents
Wiede holds a patent for a 2D image analyzer, which includes an image scaler, an image generator, and a pattern finder. The image scaler is designed to scale an image according to a specific scaling factor. The image generator produces an overview image that contains multiple copies of the received and scaled image, each scaled by a different factor. This allows for the calculation of respective positions through an algorithm that considers gaps between the scaled images and other predefined conditions. The pattern finder performs feature transformation and classification of the overview image to identify the position where the searched pattern aligns most closely with a predetermined pattern. Additionally, a post-processing unit may be included to smooth and correct the positions of local maxima in the classified overview image.
Career Highlights
Throughout his career, Christian Wiede has worked with esteemed organizations such as the Fraunhofer Society for the Advancement of Applied Research and the Technical University of Ilmenau. His experience in these institutions has contributed to his expertise in image analysis and technology development.
Collaborations
Wiede has collaborated with notable colleagues, including Andreas Ernst and Tobias Ruf. Their combined efforts have furthered advancements in the field of image processing and analysis.
Conclusion
Christian Wiede's contributions to the field of 2D image analysis through his innovative patent demonstrate his commitment to advancing technology. His work continues to influence the way images are analyzed and processed in various applications.