The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2018
Filed:
Aug. 04, 2016
Fraunhofer-gesellschaft Zur Foerderung Der Angewandten Forschung E.v., Munich, DE;
Daniel Krenzer, Wutha-Farnroda, DE;
Albrecht Hess, Schoenbrunn, DE;
András Kátai, Ilmenau, DE;
Christian Wiede, Chemnitz, DE;
Andreas Ernst, Weiden, DE;
Tobias Ruf, Burgau, DE;
Abstract
A 2D image analyzer includes an image scaler, an image generator and a pattern finder. The image scaler is configured to scale an image according to a scaling factor. The image generator is configured to produce an overview image including a plurality of copies of the received and scaled image, wherein every copy is scaled about a different scaling factor. Thereby, the respective position can be calculable by an algorithm, which considers a gap between the scaled images in the overview image, a gap of the scaled image towards one or more borders of the overview image and/or other predefined conditions. The pattern finder is configured to perform a feature transformation and classification of the overview image in order to output a position at which an accordance of the searched pattern and the predetermined pattern is maximal. A post-processing unit for smoothening and correcting the position of local maxima in the classified overview image may also be provided.