Villach, Austria

Christian Musshoff

This inventor holds 3 USPTO granted patents. Top assignee: Infineon Technologies Ag. Active years: 2007-2018.


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2007-2018

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3 patents (USPTO):Explore Patents

Title: Christian Musshoff: Innovator in Semiconductor Testing

Introduction

Christian Musshoff is a notable inventor based in Villach, Austria. He has made significant contributions to the field of semiconductor testing, holding a total of 3 patents. His work focuses on innovative methods that enhance the efficiency and accuracy of testing semiconductor dies.

Latest Patents

Musshoff's latest patents include a method for testing semiconductor dies. This method involves providing a test apparatus and an electrically conductive carrier. It also includes a semiconductor substrate with multiple semiconductor dies, each equipped with contact elements. The process entails placing the substrate on the carrier, connecting it electrically, and testing the semiconductor dies through the established connections. Another patent details a similar method and apparatus for testing semiconductor dies, emphasizing the importance of precise electrical connections for effective testing.

Career Highlights

Christian Musshoff is currently employed at Infineon Technologies AG, a leading company in semiconductor solutions. His role involves developing and refining testing methods that are crucial for the production of reliable semiconductor devices. His expertise in this area has positioned him as a key player in the industry.

Collaborations

Musshoff collaborates with talented professionals such as Erwin Thalmann and Michael Leutschacher. Their combined efforts contribute to advancing semiconductor technology and improving testing methodologies.

Conclusion

Christian Musshoff's innovative work in semiconductor testing showcases his dedication to enhancing technology in this critical field. His patents reflect a commitment to improving the efficiency and reliability of semiconductor devices.

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