The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2007
Filed:
Sep. 22, 2005
Ralf Otremba, Kaufbeuren, DE;
Josef Hoglauer, Munich, DE;
Christian Musshoff, Villach, AT;
Jens Oetjen, Ottenhofen/Herdweg, DE;
Ralf Otremba, Kaufbeuren, DE;
Josef Hoglauer, Munich, DE;
Christian Musshoff, Villach, AT;
Jens Oetjen, Ottenhofen/Herdweg, DE;
Infineon Technologies AG, Munich, DE;
Abstract
A method for testing a contact region of a semiconductor module having a circuit arrangement is disclosed. In one embodiment, the semiconductor module is heated by an electrical heating current flow and the electrical and/or thermal quality of a plurality of contacts provided in the contact region is determined in the process from a temperature-dependent measurement quantity. The heating current flow is formed by a plurality of heating current pulses. The application of the heating current pulses leads to different phases of the measurement quantity. The different phases are assigned to the different contacts and evaluated correspondingly for determining the electrical and/or thermal quality of the contacts.