This inventor holds 2 USPTO granted patents and 1 EPO patent. Top assignee: Oxford Instruments Nanotechnology Tools Limited. Active years: 2017-2020.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2017-2020
Title: The Innovative Contributions of Christian Lang
Introduction
Christian Lang is a notable inventor based in Oxon, GB. He has made significant contributions to the field of microscopy and material analysis, holding 2 patents that showcase his innovative approach to scientific challenges.
Latest Patents
One of his latest patents is titled "Analysis with preliminary survey." This invention provides a method and apparatus for analyzing a specimen in a microscope. A first survey collects analytical data from a region of interest on the specimen surface using a first set of conditions. Following this, a second survey collects additional analytical data from selected parts of the region of interest using a different set of conditions. The analytical data from the first survey is utilized to select the parts for data collection in the second survey and to determine the order in which they are analyzed.
Another significant patent by Lang is the "Method of reducing the thickness of a target sample." This method involves obtaining reference data that represents x-rays generated by a particle beam directed at a reference sample under specific beam conditions. The particle beam is then directed at a region of the target sample under different conditions, and the resultant x-rays are monitored. Output data is calculated based on the reference and monitored data, allowing for the removal of material from the region to reduce its thickness.
Career Highlights
Christian Lang is currently employed at Oxford Instruments Nanotechnology Tools Limited, where he applies his expertise in nanotechnology and material science. His work has contributed to advancements in the field, particularly in microscopy and sample analysis.
Collaborations
Lang collaborates with esteemed colleagues such as James Corrin and Peter John Statham, further enhancing the innovative environment at his workplace.
Conclusion
Christian Lang's contributions to the field of microscopy and material analysis through his patents demonstrate his commitment to innovation and scientific advancement. His work continues to influence the industry and inspire future developments.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile